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Fermi level dependent defect formation at Cu(In,Ga)Se2 interfaces

Klein, Andreas and Fritsche, J. and Jaegermann, W. and Schön, J. H. and Kloc, C. and Bucher, E. (2000):
Fermi level dependent defect formation at Cu(In,Ga)Se2 interfaces.
In: Applied Surface Science, 166 (1-4), pp. 508-512, ISSN 01694332,
[Article]

Item Type: Article
Erschienen: 2000
Creators: Klein, Andreas and Fritsche, J. and Jaegermann, W. and Schön, J. H. and Kloc, C. and Bucher, E.
Title: Fermi level dependent defect formation at Cu(In,Ga)Se2 interfaces
Language: German
Journal or Publication Title: Applied Surface Science
Volume: 166
Number: 1-4
Divisions: 11 Department of Materials and Earth Sciences
11 Department of Materials and Earth Sciences > Material Science
11 Department of Materials and Earth Sciences > Material Science > Surface Science
Date Deposited: 19 Nov 2008 15:57
Identification Number: doi:10.1016/S0169-4332(00)00484-0
License: [undefiniert]
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