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German

Klein, Andreas and Fritsche, J. and Jaegermann, W. and Schön, J. H. and Kloc, C. and Bucher, E. (2000):
Fermi level dependent defect formation at Cu(In,Ga)Se2 interfaces.
166, In: Applied Surface Science, (1-4), pp. 508-512. ISSN 01694332,
[Article]

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