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Hatzfeld, Christian and Bilz, Johannes and Schlemmer, Sascha and Adolf, Jan-Eric and Gu, Yangyang and Elgner, Steffen and Kupnik, Mario (2017):
Residual Analysis to Compare Measurement Series’ Differences with Significance and Size Measures.
IEEE SENSORS, Glasgow, [Conference or Workshop Item]

This list was generated on Tue Dec 1 02:40:39 2020 CET.