Article

Drogowska, K. ; Tarnawski, Z. ; Brudnik, A. ; Kusior, E. ; Sokolowski, M. ; Zakrzewska, K. ; Reszka, A. ; Kim-Ngan, N.-T. H. ; Balogh, A. G. (2012)
RBS, XRR and optical reflectivity measurements of Ti-TiO2 thin films deposited by magnetron sputtering.
In: Materials Research Bulletin, 47 (2)
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