2023

Scherer, Michael ; Ameres, Marie-Gabrielle ; Rheinheimer, Wolfgang ; Frömling, Till ; Rödel, Jürgen ; Fulanovic, Lovro (2023)
Blacklight sintering of BaTiO3 ceramics.
In: Journal of the European Ceramic Society, 43 (12)
doi: 10.1016/j.jeurceramsoc.2023.04.034
Artikel, Bibliographie

Porz, Lukas ; Scherer, Michael ; Höfling, Marion ; Nakamura, Atsutomo ; Rheinheimer, Wolfgang ; Rödel, Jürgen (2023)
Dislocation-based high-temperature plasticity of polycrystalline perovskite SrTiO3.
In: Journal of Materials Science, 58
doi: 10.1007/s10853-022-07405-3
Artikel, Bibliographie

2022

Muhammad, Qaisar Khushi ; Scherer, Michael ; Opitz, Alexander Karl ; Taibl, Stefanie ; Boehme, Christin ; Rohnke, Marcus ; Janek, Jürgen ; Gao, Shuang ; Fleig, Jürgen ; Frömling, Till (2022)
Dislocation-Mediated Oxygen−Ionic Conductivity in Yttria-Stabilized Zirconia.
In: ASC Nano, 16 (10)
doi: 10.1021/acsnano.2c06121
Artikel, Bibliographie

Porz, Lukas ; Scherer, Michael ; Muhammad, Qaisar Khushi ; Higuchi, Kimitaka ; Li, Yan ; Koga, Shuhei ; Nakamura, Atsutomo ; Rheinheimer, Wolfgang ; Frömling, Till (2022)
Microstructure and conductivity of blacklight-sinteredTiO2, YSZ, and Li0.33La0.57TiO3.
In: Journal of the American Ceramic Society, 105 (12)
doi: 10.1111/jace.18686
Artikel, Bibliographie

Höfling, Marion ; Porz, Lukas ; Scherer, Michael ; Gao, Shuang ; Zhuo, Fangping ; Isaia, Daniel ; Rödel, Jürgen (2022)
High‑temperature plastic deformation of <110>‑oriented BaTiO3 single crystals.
In: Journal of Materials Research, 37 (3)
doi: 10.1557/s43578-022-00485-6
Artikel, Bibliographie

Porz, Lukas ; Scherer, Michael ; Muhammad, Qaisar Khushi ; Higuchi, Kimitaka ; Li, Yan ; Koga, Shuhei ; Nakamura, Atsutomo ; Rheinheimer, Wolfgang ; Frömling, Till (2022)
Microstructure and conductivity of blacklight‐sintered TiO₂, YSZ, and Li₀.₃₃La₀.₅₇TiO₃.
In: Journal of the American Ceramic Society, 105 (12)
doi: 10.1111/jace.18686
Artikel, Bibliographie

2021

Zhao, Changhao ; Gao, Shuang ; Yang, Tiannan ; Scherer, Michael ; Schultheiß, Jan ; Meier, Dennis ; Tan, Xiaoli ; Kleebe, Hans-Joachim ; Chen, Long-Qing ; Koruza, Jurij ; Rödel, Jürgen (2021)
Precipitation Hardening in Ferroelectric Ceramics.
In: Advanced Materials, 33 (36)
doi: 10.1002/adma.202102421
Artikel, Bibliographie

Porz, Lukas ; Knez, D. ; Scherer, Michael ; Ganschow, Steffen ; Kothleitner, G. ; Rettenwander, Daniel (2021)
Dislocations in ceramic electrolytes for solid‑state Li batteries.
In: Scientific Reports, 11
doi: 10.1038/s41598-021-88370-w
Artikel, Bibliographie

2014

Stolz, Sebastian ; Scherer, Michael ; Mankel, Eric ; Lovrinčić, Robert ; Schinke, Janusz ; Kowalsky, Wolfgang ; Jaegermann, Wolfram ; Lemmer, Uli ; Mechau, Norman ; Hernandez-Sosa, Gerardo (2014)
Investigation of Solution-Processed Ultrathin Electron Injection Layers for Organic Light-Emitting Diodes.
In: ACS Applied Materials & Interfaces, 6 (9)
doi: 10.1021/am500287y
Artikel, Bibliographie

2013

Saive, Rebecca ; Scherer, Michael ; Mueller, Christian ; Daume, Dominik ; Schinke, Janusz ; Kroeger, Michael ; Kowalsky, Wolfgang (2013)
Imaging the electric potential within organic solar cells.
In: Advanced Functional Materials
Artikel, Bibliographie

Scherer, Michael ; Saive, Rebecca ; Daume, Dominik ; Kröger, Michael ; Kowalsky, Wolfgang (2013)
Sample preparation for scanning Kelvin probe microscopy studies on cross sections of organic solar cells.
In: AIP Advances, 3 (092134)
Artikel, Bibliographie

Scherer, Michael ; Saive, Rebecca ; Daume, Dominik ; Kröger, Michael ; Kowalsky, Wolfgang (2013)
Sample preparation for scanning Kelvin probe studies on organic solar cells.
ESPMI VII. Rehovot, Israel
Konferenzveröffentlichung, Bibliographie

Scherer, Michael ; Saive, Rebecca ; Daume, Dominik ; Kröger, Michael ; Kowalsky, Wolfgang (2013)
Sample preparation for scanning Kelvin probe studies on organic solar cells.
Kirchhoff-Institut für Physik, Heidelberg
Konferenzveröffentlichung, Bibliographie

2012

Saive, Rebecca ; Ullrich, Florian ; Müller, Lars ; Scherer, Michael ; Daume, Dominik ; Kröger, Michael ; Kowalsky, Wolfgang (2012)
Scanning Kelvin Probe Microscopy on FIB-milled crosssections in organic semiconductor devices.
DPG conference. Berlin, Germany (25.03.2012-30.03.2012)
Konferenzveröffentlichung, Bibliographie