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Sample preparation for scanning Kelvin probe microscopy studies on cross sections of organic solar cells

Scherer, Michael and Saive, Rebecca and Daume, Dominik and Kröger, Michael and Kowalsky, Wolfgang (2013):
Sample preparation for scanning Kelvin probe microscopy studies on cross sections of organic solar cells.
In: AIP Advances, 3, (092134), [Online-Edition: http://dx.doi.org/10.1063/1.4824323],
[Article]

Item Type: Article
Erschienen: 2013
Creators: Scherer, Michael and Saive, Rebecca and Daume, Dominik and Kröger, Michael and Kowalsky, Wolfgang
Title: Sample preparation for scanning Kelvin probe microscopy studies on cross sections of organic solar cells
Language: English
Journal or Publication Title: AIP Advances
Volume: 3
Number: 092134
Divisions: 16 Department of Mechanical Engineering > Institute of Printing Science and Technology (IDD)
16 Department of Mechanical Engineering
Event Title: JSAP-MRS Joint Symposia
Event Location: Kyoto, Japan
Date Deposited: 06 Nov 2013 07:13
Official URL: http://dx.doi.org/10.1063/1.4824323
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