Saive, Rebecca ; Scherer, Michael ; Mueller, Christian ; Daume, Dominik ; Schinke, Janusz ; Kroeger, Michael ; Kowalsky, Wolfgang (2013)
Imaging the electric potential within organic solar cells.
In: Advanced Functional Materials
Artikel, Bibliographie

Nanova, Diana ; Ostermann, Johannes ; Daume, Dominik ; Saive, Rebecca ; Dieterle, Levin ; Pfannmöller, Martin ; Schröder, Rasmus R. ; Kowalsky, Wolfgang ; Kröger, Michael (2013)
Morphology and interdiffusion in organic donor-acceptor blends studied by analytical TEM.
Winterschool 2013 der Heidelberger Graduate School of Fundamental Physics. Heidelberg, Germany
Konferenzveröffentlichung, Bibliographie

Scherer, Michael ; Saive, Rebecca ; Daume, Dominik ; Kröger, Michael ; Kowalsky, Wolfgang (2013)
Sample preparation for scanning Kelvin probe microscopy studies on cross sections of organic solar cells.
In: AIP Advances, 3 (092134)
Artikel, Bibliographie

Scherer, Michael ; Saive, Rebecca ; Daume, Dominik ; Kröger, Michael ; Kowalsky, Wolfgang (2013)
Sample preparation for scanning Kelvin probe studies on organic solar cells.
ESPMI VII. Rehovot, Israel
Konferenzveröffentlichung, Bibliographie

Scherer, Michael ; Saive, Rebecca ; Daume, Dominik ; Kröger, Michael ; Kowalsky, Wolfgang (2013)
Sample preparation for scanning Kelvin probe studies on organic solar cells.
Kirchhoff-Institut für Physik, Heidelberg
Konferenzveröffentlichung, Bibliographie

Nanova, Diana ; Ostermann, Johannes Michael ; Daume, Dominik ; Saive, Rebecca ; Dieterle, Levin ; Pfannmöller, Martin ; Schröder, Rasmus R. ; Kowalsky, Wolfgang ; Kröger, Michael (2012)
Morphology and interdiffusion in organic donor-acceptor blends studied by analytical TEM.
ISOE 2012. Okinawa, Japan
Konferenzveröffentlichung, Bibliographie

Nanova, Diana ; Ostermann, Johannes ; Daume, Dominik ; Saive, Rebecca ; Dieterle, Levin ; Pfannmöller, Martin ; Schröder, Rasmus R. ; Kowalsky, Wolfgang ; Kröger, Michael (2012)
Morphology and interdiffusion in organic donor-acceptor blends studied by analytical TEM.
MRS Fall Meeting. Boston, USA
Konferenzveröffentlichung, Bibliographie

Saive, Rebecca ; Ullrich, Florian ; Müller, Lars ; Scherer, Michael ; Daume, Dominik ; Kröger, Michael ; Kowalsky, Wolfgang (2012)
Scanning Kelvin Probe Microscopy on FIB-milled crosssections in organic semiconductor devices.
DPG conference. Berlin, Germany (25.03.2012-30.03.2012)
Konferenzveröffentlichung, Bibliographie