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Scanning Kelvin Probe Microscopy on FIB-milled crosssections in organic semiconductor devices

Saive, Rebecca and Ullrich, Florian and Müller, Lars and Scherer, Michael and Daume, Dominik and Kröger, Michael and Kowalsky, Wolfgang (2012):
Scanning Kelvin Probe Microscopy on FIB-milled crosssections in organic semiconductor devices.
In: DPG conference, Berlin, Germany, 25.03.-30.03.2012, [Conference or Workshop Item]

Item Type: Conference or Workshop Item
Erschienen: 2012
Creators: Saive, Rebecca and Ullrich, Florian and Müller, Lars and Scherer, Michael and Daume, Dominik and Kröger, Michael and Kowalsky, Wolfgang
Title: Scanning Kelvin Probe Microscopy on FIB-milled crosssections in organic semiconductor devices
Language: English
Divisions: 16 Department of Mechanical Engineering > Institute of Printing Science and Technology (IDD)
16 Department of Mechanical Engineering
Event Title: DPG conference
Event Location: Berlin, Germany
Event Dates: 25.03.-30.03.2012
Date Deposited: 06 Nov 2013 07:00
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