Artikel

Vázquez, R. ; Rubio-Sierra, F. J. ; Stark, R. W. (2007)
Multimodal analysis of force spectroscopy based on a transfer function study of micro-cantilevers.
In: Nanotechnology, 18 (18)
doi: 10.1088/0957-4484/18/18/185504
Artikel, Bibliographie

Rubio-Sierra, F. J. ; Vazquez, R. ; Stark, R. W. (2006)
Transfer Function Analysis of the Micro Cantilever used in Atomic Force Microscopy.
In: IEEE Transactions on Nanotechnology, 5 (6)
doi: 10.1109/TNANO.2006.883479
Artikel, Bibliographie

Rubio-Sierra, F. J. ; Yurtsever, A. ; Hennemeyer, M. ; Heckl, W. M. ; Stark, R. W. (2006)
Acoustical force nano-lithography of thin polymer films.
In: Physica Status Solidi (A), 203 (6)
doi: 10.1002/pssa.200566152
Artikel, Bibliographie

Rubio-Sierra, F. J. ; Heckl, W. M. ; Stark, R. W. (2005)
Nanomanipulation by Atomic Force Microscopy.
In: Advanced Engineering Materials, 7 (4)
doi: 10.1002/adem.200400174
Artikel, Bibliographie

Stark, R. W. ; Rubio-Sierra, F. J. ; Thalhammer, S. ; Heckl, W. M. (2003)
Combined nanomanipulation by atomic force microscopy and UV-laser ablation for chromosomal dissection.
In: European Biophysics Journal, 32
doi: 10.1007/s00249-002-0270-y
Artikel, Bibliographie

Rubio-Sierra, F. J. ; Stark, R. W. ; Thalhammer, S. ; Heckl, W. M. (2003)
Force feedback joystick as a low cost haptic interface for an atomic force microscopy nanomanipulator.
In: Applied Physics A, 76
doi: 10.1007/s00339-002-1973-8
Artikel, Bibliographie

Konferenzveröffentlichung

Vazquez, R. ; Rubio-Sierra, F. J. ; Stark, R. W. (2006)
Transfer Function Analysis of a Surface Coupled Atomic Force Microscope.
American Control Conference. Minneapolis, USA
doi: 10.1109/ACC.2006.1655411
Konferenzveröffentlichung, Bibliographie

Vazquez, R. ; Rubio-Sierra, F. J. ; Stark, R. W. (2005)
Transfer function analysis of atomic force microscope cantilevers.
ASME Int. Mech. Eng. Conf. Exhibition. IMECE, Orlando, FL, USA (05.11.2005-11.11.2005)
Konferenzveröffentlichung, Bibliographie

Rubio-Sierra, F. J. ; Burghardt, S. ; Heckl, W. M. ; Stark, R. (2004)
Atomic Force Microscope as a tool for nanomanipulation.
Actuator 2004, Proc. 9th Int. Conf. on New Actuators. Bremen, Germany
Konferenzveröffentlichung, Bibliographie

Rubio-Sierra, F. J. ; Burghardt, S. ; Kempe, A. ; Heckl, W. M. ; Stark, R. W. (2004)
Atomic force microscope based nanomanipulator for mechanical and optical lithography.
Proc. 2004 4th IEEE Conf. Nanotechnology. Munich, Germany (17.08.2004-19.08.2004)
Konferenzveröffentlichung, Bibliographie