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Number of items: 13.

Pankalla, Sebastian (2014):
Modellierung der technologiebasierten Einflüsse auf das Bauteilverhalten gedruckter organischer Transistoren.
TU Darmstadt, [Online-Edition: http://tuprints.ulb.tu-darmstadt.de/4040],
[Ph.D. Thesis]

Ganz, Simone and Pankalla, Sebastian and Sauer, Hans Martin and Glesner, Manfred and Dörsam, Edgar (2013):
Printing technique dependent charge carrier velocity distribution in organic thin film transistors.
In: Graduate Seminar in Organic and Printed Electronics, Tampere University of Technology - Department of Electronics, [Conference or Workshop Item]

Pankalla, Sebastian and Spiehl, Dieter and Sauer, Hans Martin and Dörsam, Edgar and Glesner, Manfred (2013):
Improved contact resistivity and intra-die variation in organic thin film transistors.
In: Applied Physics Letters, American Institute of Physics (AIP), 102, (17), [Online-Edition: http://dx.doi.org/10.1063/1.4804239],
[Article]

Pankalla, Sebastian and Ganesan, Ramkumar and Spiehl, Dieter and Sauer, Hans Martin and Dörsam, Edgar and Glesner, Manfred (2013):
Mass characterisation of organic transistors and Monte-Carlo circuit simulation.
In: Organic Electronics, Elsevier B.V., pp. 676-681, 14, (2), [Online-Edition: http://dx.doi.org/10.1016/j.orgel.2012.11.033],
[Article]

Pankalla, Sebastian and Ganz, Simone and Spiehl, Dieter and Dörsam, Edgar and Glesner, Manfred (2013):
Organic thin-film transistors for circuits in a foundry: process, charge transport phenomena and device library.
In: Proceedings of the SPIE - The International Society for Optical Engineering, pp. 88310C-1-88310C-22, 8831, [Online-Edition: doi: 10.1117/12.2023011],
[Article]

Ganz, Simone and Pankalla, Sebastian and Sauer, Hans Martin and Glesner, Manfred and Dörsam, Edgar (2013):
Printing technique dependent charge carrier velocity distribution in organic thin film transistors.
In: Proceedings of the SPIE - The International Society for Optical Engineering, pp. 883114-1-883114-11, 8831, [Online-Edition: http://dx.doi.org/10.1117/12.2023244],
[Article]

Ganz, Simone and Pankalla, Sebastian and Glesner, Manfred and Dörsam, Edgar (2013):
Process dependent leakage currents in printed organic dielectric layers.
In: International Conference on Organic Electronics (ICOE), Grenoble, France, 2013, [Conference or Workshop Item]

Spiehl, Dieter and Pankalla, Sebastian and Glesner, Manfred and Dörsam, Edgar (2012):
Analysis of the mobility of printed organic p-channel transistors depending on the transistor geometry and orientation.
In: Journal of Physics: Conference Series, IOP Publishing Ltd, pp. 012013, 345, (1), [Article]

Sauer, Hans Martin and Spiehl, Dieter and Pankalla, Sebastian and Dörsam, Edgar (2012):
Electrical Noise of printed OFETs and Layer Morphology.
In: Large-area, Organic & Printed Electronics Convention (LOPE-C), Munich, Germany, June 19-21, [Conference or Workshop Item]

Pankalla, Sebastian and Spiehl, Dieter and Dörsam, Edgar and Glesner, Manfred (2012):
Variation of electrical parameters of organic thin film transistors as a function of semiconductors layer thickness.
In: 2nd Winter School of Organic Electronics, Heidelberg, Germany, March 5, 2012, [Conference or Workshop Item]

Spiehl, Dieter and Pankalla, Sebastian and Glesner, Manfred and Dörsam, Edgar (2011):
Analysis of the mobility of printed organic p-channel transistors depending on the transistor geometry and orientation.
In: IVth International Competition of Scientific Papers in Nanotechnology for Young Researchers at Rusnanotech 2011, Moscow, Russia, October 26-28, 2011, [Conference or Workshop Item]

Pankalla, Sebastian and Hengen, S. and Spiehl, Dieter and Dörsam, Edgar and Giehl, J. and Glesner, Manfred (2011):
Threshold Voltage and Mobility Fluctuations of Printed Organic Transistors.
In: Proceedings of the 4th International Symposium on Flexible Organic Electronics (IS-FOE11), Thessaloniki, Greece, 10.07.2011 - 13.07.2011, [Conference or Workshop Item]

Hengen, S. and Pankalla, Sebastian and Spiehl, Dieter and Dörsam, Edgar and Glesner, Manfred and Giehl, J. (2010):
A New Measurement Standard for Organic Thin Film Transistors.
In: 1st Winter School of Organic Electronics, [Conference or Workshop Item]

This list was generated on Sat Oct 19 00:34:24 2019 CEST.