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A New Measurement Standard for Organic Thin Film Transistors

Hengen, S. and Pankalla, Sebastian and Spiehl, Dieter and Dörsam, Edgar and Glesner, Manfred and Giehl, J. (2010):
A New Measurement Standard for Organic Thin Film Transistors.
In: 1st Winter School of Organic Electronics, [Conference or Workshop Item]

Item Type: Conference or Workshop Item
Erschienen: 2010
Creators: Hengen, S. and Pankalla, Sebastian and Spiehl, Dieter and Dörsam, Edgar and Glesner, Manfred and Giehl, J.
Title: A New Measurement Standard for Organic Thin Film Transistors
Language: English
Divisions: 16 Department of Mechanical Engineering > Institute of Printing Science and Technology (IDD)
16 Department of Mechanical Engineering
Event Title: 1st Winter School of Organic Electronics
Date Deposited: 31 Jan 2011 16:41
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