Pankalla, Sebastian and Spiehl, Dieter and Sauer, Hans Martin and Dörsam, Edgar and Glesner, Manfred (2013):
Improved contact resistivity and intra-die variation in organic thin film transistors.
In: Applied Physics Letters, 102 (17), American Institute of Physics (AIP), [Article]
Official URL: http://dx.doi.org/10.1063/1.4804239
Item Type: | Article |
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Erschienen: | 2013 |
Creators: | Pankalla, Sebastian and Spiehl, Dieter and Sauer, Hans Martin and Dörsam, Edgar and Glesner, Manfred |
Title: | Improved contact resistivity and intra-die variation in organic thin film transistors |
Language: | English |
Journal or Publication Title: | Applied Physics Letters |
Journal volume: | 102 |
Number: | 17 |
Publisher: | American Institute of Physics (AIP) |
Divisions: | 16 Department of Mechanical Engineering 16 Department of Mechanical Engineering > Institute of Printing Science and Technology (IDD) Exzellenzinitiative Exzellenzinitiative > Clusters of Excellence Zentrale Einrichtungen Exzellenzinitiative > Clusters of Excellence > Center of Smart Interfaces (CSI) |
Date Deposited: | 14 May 2013 07:20 |
Official URL: | http://dx.doi.org/10.1063/1.4804239 |
Identification Number: | 173303 |
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