Pankalla, Sebastian and Spiehl, Dieter and Sauer, Hans Martin and Dörsam, Edgar and Glesner, Manfred (2013):
Improved contact resistivity and intra-die variation in organic thin film transistors.
In: Applied Physics Letters, 102 (17), American Institute of Physics (AIP), [Online-Edition: http://dx.doi.org/10.1063/1.4804239],
[Article]
Official URL: http://dx.doi.org/10.1063/1.4804239
| Item Type: | Article |
|---|---|
| Erschienen: | 2013 |
| Creators: | Pankalla, Sebastian and Spiehl, Dieter and Sauer, Hans Martin and Dörsam, Edgar and Glesner, Manfred |
| Title: | Improved contact resistivity and intra-die variation in organic thin film transistors |
| Language: | English |
| Journal or Publication Title: | Applied Physics Letters |
| Volume: | 102 |
| Number: | 17 |
| Publisher: | American Institute of Physics (AIP) |
| Divisions: | 16 Department of Mechanical Engineering 16 Department of Mechanical Engineering > Institute of Printing Science and Technology (IDD) Exzellenzinitiative Exzellenzinitiative > Clusters of Excellence Zentrale Einrichtungen Exzellenzinitiative > Clusters of Excellence > Center of Smart Interfaces (CSI) |
| Date Deposited: | 14 May 2013 07:20 |
| Official URL: | http://dx.doi.org/10.1063/1.4804239 |
| Identification Number: | 173303 |
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