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Improved contact resistivity and intra-die variation in organic thin film transistors

Pankalla, Sebastian and Spiehl, Dieter and Sauer, Hans Martin and Dörsam, Edgar and Glesner, Manfred (2013):
Improved contact resistivity and intra-die variation in organic thin film transistors.
In: Applied Physics Letters, 102 (17), American Institute of Physics (AIP), [Online-Edition: http://dx.doi.org/10.1063/1.4804239],
[Article]

Item Type: Article
Erschienen: 2013
Creators: Pankalla, Sebastian and Spiehl, Dieter and Sauer, Hans Martin and Dörsam, Edgar and Glesner, Manfred
Title: Improved contact resistivity and intra-die variation in organic thin film transistors
Language: English
Journal or Publication Title: Applied Physics Letters
Volume: 102
Number: 17
Publisher: American Institute of Physics (AIP)
Divisions: 16 Department of Mechanical Engineering
16 Department of Mechanical Engineering > Institute of Printing Science and Technology (IDD)
Exzellenzinitiative
Exzellenzinitiative > Clusters of Excellence
Zentrale Einrichtungen
Exzellenzinitiative > Clusters of Excellence > Center of Smart Interfaces (CSI)
Date Deposited: 14 May 2013 07:20
Official URL: http://dx.doi.org/10.1063/1.4804239
Identification Number: 173303
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