Englisch

Stark, R. W. ; Naujoks, N. ; Stemmer, A. (2007)
Multifrequency electrostatic force microscopy in the repulsive regime.
In: Nanotechnology, 18 (6)
doi: 10.1088/0957-4484/18/6/065502
Artikel, Bibliographie

Stark, R. W. ; Naujoks, N. ; Stemmer, A. (2005)
Detection of Injected Charges by Kelvin Probe and Multi-mode Electrostatic Force Microscopy.
Proc. 5th IEEE Conf. Nanotechnology. Nagoya, Japan
Konferenzveröffentlichung, Bibliographie