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Number of items: 2.

Stark, R. W. and Naujoks, N. and Stemmer, A. (2007):
Multifrequency electrostatic force microscopy in the repulsive regime.
In: Nanotechnology, vol. 1, (Art. 0), [Article]

Stark, R. W. and Naujoks, N. and Stemmer, A. (2005):
Detection of Injected Charges by Kelvin Probe and Multi-mode Electrostatic Force Microscopy.
In: Proc. 5th IEEE Conf. Nanotechnology, Nagoya, Japan, [Conference or Workshop Item]

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