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Number of items: 2.

Horn, Joachim ; Marx, ; Weiss, ; Hartnagel, ; Stehle, ; Bischoff, ; Pagnia, (1995)
High resolution surface characterization using STM light emission techniques.
In: Passivation of metals and semiconductors, Edition: Aedermannsdorf: Trans Tech Publ., 1995
Book Section, Bibliographie

Stehle, M. ; Bischoff, ; Pagnia, ; Horn, ; Marx, ; Weiss, ; Hartnagel, (1995)
Time-resolved luminscence measurements on GaAs homostructures using pulse excitation of a scanning tunneling microscope.
In: Journal of vacuum science and technology. B 13 (1995), S. 305-307
Article, Bibliographie

This list was generated on Sat Apr 13 00:10:51 2024 CEST.