Englisch

Sanchez Guinea, Alejandro ; Boytsov, Andrey ; Mouline, Ludovic ; Le Traon, Yves (2019)
Smart discovery of periodic-frequent human routines for home automation.
Houston, USA (12.11.2019-14.11.2019)
doi: 10.1145/3360774.3360784
Konferenzveröffentlichung, Bibliographie

Li, Li ; Bartel, Alexandre ; Bissyande, Tegawende ; Klein, Jacques ; Le Traon, Yves ; Arzt, Steven ; Rasthofer, Siegfried ; Bodden, Eric ; Octeau, Damien ; McDaniel, Patrick (2015)
IccTA: Detecting Inter-Component Privacy Leaks in Android Apps.
Konferenzveröffentlichung, Bibliographie

Arzt, Steven ; Rasthofer, Siegfried ; Fritz, Christian ; Bodden, Eric ; Bartel, Alexandre ; Klein, Jacques ; Le Traon, Yves ; Octeau, Damien ; McDaniel, Patrick (2014)
Flowdroid: Precise context, flow, field, object-sensitive and lifecycle-aware taint analysis for android apps.
Proceedings of the 35th ACM SIGPLAN Conference on Programming Language Design and Implementation. Edinburgh
Konferenzveröffentlichung, Bibliographie

Li, Li ; Bartel, Alexandre ; Klein, Jacques ; Le Traon, Yves ; Arzt, Steven ; Rasthofer, Siegfried ; Bodden, Eric ; Octeau, Damien ; McDaniel, Patrick (2014)
I know what leaked in your pocket: uncovering privacy leaks on Android Apps with Static Taint Analysis.
Report, Bibliographie

Octeau, Damien ; McDaniel, Patrick ; Jha, Somesh ; Bartel, Alexandre ; Bodden, Eric ; Klein, Jacques ; Le Traon, Yves (2013)
Effective Inter-Component Communication Mapping in Android: An Essential Step Towards Holistic Security Analysis.
In: Proceedings of the 22nd USENIX Conference on Security
Buchkapitel, Bibliographie

Fritz, Christian ; Arzt, Steven ; Rasthofer, Siegfried ; Bodden, Eric ; Bartel, Alexandre ; Klein, Jacques ; Le Traon, Yves ; Octeau, Damien ; McDaniel, Patrick (2013)
Highly Precise Taint Analysis for Android Applications.
Report, Bibliographie

Perrouin, Gilles ; Oster, Sebastian ; Sen, Sagar ; Klein, Jacques ; Baudry, Benoit ; Le Traon, Yves (2011)
Pairwise Testing for Software Product Lines: Comparison of Two Approaches.
In: Software Quality Journal - Special issue on Quality Engineering for Software Product Lines, 20 (3-4)
Artikel, Bibliographie