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Bretones Cassoli, Beatriz ; Jourdan, Nicolas ; Nguyen, Phu H. ; Sen, Sagar ; Garcia-Ceja, Enrique ; Metternich, Joachim (2022)
Frameworks for data-driven quality management in cyber-physical systems for manufacturing: A systematic review.
In: Procedia CIRP, 112
doi: 10.1016/j.procir.2022.09.062
Artikel, Bibliographie
Jourdan, Nicolas ; Sen, Sagar ; Husom, Erik Johannes ; Garcia-Ceja, Enrique ; Biegel, Tobias ; Metternich, Joachim (2021)
On The Reliability Of Machine Learning Applications In Manufacturing Environments.
35th Conference on Neural Information Processing Systems (NeurIPS 2021). Virtual Only (06.12.2021-14.12.2021)
Konferenzveröffentlichung, Bibliographie
Perrouin, Gilles ; Oster, Sebastian ; Sen, Sagar ; Klein, Jacques ; Baudry, Benoit ; Le Traon, Yves (2011)
Pairwise Testing for Software Product Lines: Comparison of Two Approaches.
In: Software Quality Journal - Special issue on Quality Engineering for Software Product Lines, 20 (3-4)
Artikel, Bibliographie