Perrouin, Gilles and Oster, Sebastian and Sen, Sagar and Klein, Jacques and Baudry, Benoit and Traon, Yves Le
:
Pairwise Testing for Software Product Lines: Comparison of Two Approaches.
In:
Software Quality Journal - Special issue on Quality Engineering for Software Product Lines
[Article]
, (2011)
| Item Type: | Article |
|---|---|
| Erschienen: | 2011 |
| Creators: | Perrouin, Gilles and Oster, Sebastian and Sen, Sagar and Klein, Jacques and Baudry, Benoit and Traon, Yves Le |
| Title: | Pairwise Testing for Software Product Lines: Comparison of Two Approaches |
| Language: | English |
| Journal or Publication Title: | Software Quality Journal - Special issue on Quality Engineering for Software Product Lines |
| Place of Publication: | Heidelberg |
| Publisher: | Springer Verlag |
| Divisions: | 18 Department of Electrical Engineering and Information Technology 18 Department of Electrical Engineering and Information Technology > Institute of Computer Engineering > Real-Time Systems 18 Department of Electrical Engineering and Information Technology > Institute of Computer Engineering |
| Event Location: | Heidelberg |
| Date Deposited: | 01 Jun 2015 09:24 |
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