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Pairwise Testing for Software Product Lines: Comparison of Two Approaches

Perrouin, Gilles and Oster, Sebastian and Sen, Sagar and Klein, Jacques and Baudry, Benoit and Traon, Yves Le (2011):
Pairwise Testing for Software Product Lines: Comparison of Two Approaches.
In: Software Quality Journal - Special issue on Quality Engineering for Software Product Lines, Springer Verlag, [Article]

Item Type: Article
Erschienen: 2011
Creators: Perrouin, Gilles and Oster, Sebastian and Sen, Sagar and Klein, Jacques and Baudry, Benoit and Traon, Yves Le
Title: Pairwise Testing for Software Product Lines: Comparison of Two Approaches
Language: English
Journal or Publication Title: Software Quality Journal - Special issue on Quality Engineering for Software Product Lines
Place of Publication: Heidelberg
Publisher: Springer Verlag
Divisions: 18 Department of Electrical Engineering and Information Technology
18 Department of Electrical Engineering and Information Technology > Institute of Computer Engineering > Real-Time Systems
18 Department of Electrical Engineering and Information Technology > Institute of Computer Engineering
Event Location: Heidelberg
Date Deposited: 01 Jun 2015 09:24
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