1995

Kaiser, G. ; Meyer, A. ; Friess, M. ; Riedel, Ralf ; Harris, I. ; Jacob, E. (1995)
CRITICAL COMPARISON OF ICP-OES, XRF AND FLUORINE VOLATILIZATION-FTIR SPECTROMETRY FOR THE RELIABLE DETERMINATION OF THE SILICON MAIN CONSTITUENT IN CERAMIC MATERIALS.
In: FRESENIUS JOURNAL OF ANALYTICAL CHEMISTRY, 352 (3-4)
doi: 10.1007/BF00322228
Artikel, Bibliographie

Kaiser, G. ; Meyer, A. ; Friess, M. ; Riedel, R. ; Harris, M. ; Jacob, E. ; Tölg, G. (1995)
Critical comparison of ICP-OES, XRF, and fluorine volatilization-FTIR spectrometry for the reliable determination of the silicon main constituent in ceramic materials.
In: Fresenius' journal of analystical chemistry, 352 (3)
doi: 10.1007/BF00322228
Artikel, Bibliographie