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Critical comparison of ICP-OES, XRF, and fluorine volatilization-FTIR spectrometry for the reliable determination of the silicon main constituent in ceramic materials

Kaiser, G. and Meyer, and Frieß, and Riedel, and Harris, and Jacob, and Tölg, (1995):
Critical comparison of ICP-OES, XRF, and fluorine volatilization-FTIR spectrometry for the reliable determination of the silicon main constituent in ceramic materials.
In: Fresenius' journal of analystical chemistry. 352 (1995), S. 318-326, [Article]

Item Type: Article
Erschienen: 1995
Creators: Kaiser, G. and Meyer, and Frieß, and Riedel, and Harris, and Jacob, and Tölg,
Title: Critical comparison of ICP-OES, XRF, and fluorine volatilization-FTIR spectrometry for the reliable determination of the silicon main constituent in ceramic materials
Language: English
Journal or Publication Title: Fresenius' journal of analystical chemistry. 352 (1995), S. 318-326
Date Deposited: 19 Nov 2008 15:58
License: [undefiniert]
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