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Kaiser, G. and Meyer, A. and Friess, M. and Riedel, Ralf and Harris, I. and Jacob, E. (1995):
CRITICAL COMPARISON OF ICP-OES, XRF AND FLUORINE VOLATILIZATION-FTIR SPECTROMETRY FOR THE RELIABLE DETERMINATION OF THE SILICON MAIN CONSTITUENT IN CERAMIC MATERIALS.
In: FRESENIUS JOURNAL OF ANALYTICAL CHEMISTRY, 352 (3-4), Springer Verlag, New York, USA, pp. 318-326, ISSN 0937-0633,
DOI: 10.1007/BF00322228,
[Article]

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