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Kaiser, G. ; Meyer, A. ; Friess, M. ; Riedel, Ralf ; Harris, I. ; Jacob, E. (1995):
CRITICAL COMPARISON OF ICP-OES, XRF AND FLUORINE VOLATILIZATION-FTIR SPECTROMETRY FOR THE RELIABLE DETERMINATION OF THE SILICON MAIN CONSTITUENT IN CERAMIC MATERIALS.
In: FRESENIUS JOURNAL OF ANALYTICAL CHEMISTRY, 352 (3-4), pp. 318-326. Springer Verlag, New York, USA, ISSN 0937-0633,
DOI: 10.1007/BF00322228,
[Article]

Kaiser, G. ; Meyer, A. ; Fries, M. ; Riedel, R. ; Harris, M. ; Jacob, E. ; Tölg, G. (1995):
Critical comparison of ICP-OES, XRF, and fluorine volatilization-FTIR spectrometry for the reliable determination of the silicon main constituent in ceramic materials.
In: Fresenius' journal of analystical chemistry, 352 (3), pp. 318-326. Springer, DOI: 10.1007/BF00322228,
[Article]

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