Hoffmann, M. J. ; Kungl, H. ; Theissmann, R. ; Wagner, S.
eds.: Heywang, W. ; Lubitz, K. ; Werding, W. (2008)
Microstructural Analysis Based on Microscopy and X-Ray Diffraction.
In: Piezoelectricity. Evolution and Future of a Technology.
doi: 10.1007/978-3-540-68683-5
Book Section, Bibliographie