Hoffmann, M. J. ; Kungl, H. ; Theissmann, R. ; Wagner, S.
Heywang, W. ; Lubitz, K. ; Werding, W. (eds.) (2008):
Microstructural Analysis Based on Microscopy and X-Ray Diffraction.
In: Springer Series in Materials Science, 114, In: Piezoelectricity. Evolution and Future of a Technology., pp. 403-421, Springer Verlag Berlin Heidelberg, ISBN 978-3-540-68680-4,
[Book Section]
Official URL: http://dx.doi.org/10.1007/978-3-540-68683-5
Abstract
Characteristic features of ferroelectric materials are the transition in crystal structure from a cubic paraelectric phase to a lower-symmetry ferroelectric phase at the Curie temperature T c and the possibility of changing the polarization of polycrystalline materials by means of electric fields. Both features give rise to challenges with respect to X-ray analysis and microscopy.
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