Hoffmann, M. J. and Kungl, H. and Theissmann, R. and Wagner, S. Heywang, W. and Lubitz, K. and Werding, W. (eds.) (2008):
Microstructural Analysis Based on Microscopy and X-Ray Diffraction.
In: Springer Series in Materials Science, 114, In: Piezoelectricity. Evolution and Future of a Technology., pp. 403-421, Springer Verlag Berlin Heidelberg, ISBN 978-3-540-68680-4,
[Book Section]