Hoffmann, M. J. and Kungl, H. and Theissmann, R. and Wagner, S. Heywang, W. and Lubitz, K. and Werding, W. (eds.) (2008):
Microstructural Analysis Based on Microscopy and X-Ray Diffraction.
In: Springer Series in Materials Science, In: Piezoelectricity. Evolution and Future of a Technology., Springer Verlag Berlin Heidelberg, pp. 403-421, [Online-Edition: http://dx.doi.org/10.1007/978-3-540-68683-5],
[Book Section]