Englisch

Breuer, U. ; Holzbrecher, ; Gastel, ; Becker, ; Dietze, (1997)
Comparative studies of SIMS and SNMS analyses during the build up of sputter equilibrium under oxygen and rare gas ion bombardment.
In: Fresenius journal of analytical chemistry. 358 (1997), S. 47-50
Artikel, Bibliographie

Breuer, U. ; Holzbrecher, ; Gastel, ; Becker, ; Dietze, (1997)
Comparison of SIMS and e-beam SNMS depth profiling results using oxygen, cesium and argon as primary ions.
Konferenzveröffentlichung, Bibliographie