Breuer, U. and Holzbrecher, and Gastel, and Becker, and Dietze, (1997):
Comparative studies of SIMS and SNMS analyses during the build up of sputter equilibrium under oxygen and rare gas ion bombardment.
In: Fresenius journal of analytical chemistry. 358 (1997), S. 47-50, [Article]

Breuer, U. and Holzbrecher, and Gastel, and Becker, and Dietze, (1997):
Comparison of SIMS and e-beam SNMS depth profiling results using oxygen, cesium and argon as primary ions.
In: International Conference on Secondary Ion Mass Spectrometry <10, 1997>: Proceedings. Hrsg.: A. Benninghoven (u.a.) S. 391-394, Chicheter: Wiley, 1997, Chicheter, Wiley, [Conference or Workshop Item]