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Chemical characterization of modified nanotips by TOF-SIMS and Laser-SNMS.
Proc. XII Conf. on Secondary Ion Mass Spectroscopy SIMS XII. Brussels
Conference or Workshop Item, Bibliographie

Breuer, U. ; Holzbrecher, H. ; Gastel, M. ; Becker, J. S. ; Dietze, H.-J.
ed.: Benninghoven, A. (1997)
Comparison of SIMS and e-beam SNMS depth profiling results using oxygen, cesium and argon as primary ions.
International Conference on Secondary Ion Mass Spectrometry (SIMS X). Muenster (October 1-6, 1995)
Conference or Workshop Item, Bibliographie