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Microstructure analysis of ohmic contacts on MBE grown n-GaSb and investigation of submicron contacts

Sigmund, Jochen ; Saglam, M. ; Vogt, Alexander ; Hartnagel, H. L. ; Buschmann, V. ; Wieder, Thomas ; Fuess, H. (2001)
Microstructure analysis of ohmic contacts on MBE grown n-GaSb and investigation of submicron contacts.
In: Journal of Crystal Growth, 227-228
doi: 10.1016/S0022-0248(01)00785-0
Article, Bibliographie

Item Type: Article
Erschienen: 2001
Creators: Sigmund, Jochen ; Saglam, M. ; Vogt, Alexander ; Hartnagel, H. L. ; Buschmann, V. ; Wieder, Thomas ; Fuess, H.
Type of entry: Bibliographie
Title: Microstructure analysis of ohmic contacts on MBE grown n-GaSb and investigation of submicron contacts
Language: English
Date: 1 July 2001
Publisher: Elsevier
Journal or Publication Title: Journal of Crystal Growth
Volume of the journal: 227-228
DOI: 10.1016/S0022-0248(01)00785-0
Divisions: 11 Department of Materials and Earth Sciences
11 Department of Materials and Earth Sciences > Material Science
11 Department of Materials and Earth Sciences > Material Science > Structure Research
18 Department of Electrical Engineering and Information Technology
18 Department of Electrical Engineering and Information Technology > Microwave Electronics
Date Deposited: 19 Nov 2008 16:28
Last Modified: 09 Apr 2021 09:51
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