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Microstructure analysis of Ohmic contacts on MBE grown n-GaSb layers and investigation of submicron contacts

Sigmund, Jochen ; Saglam, M. ; Vogt, Alexander ; Hartnagel, H. L. ; Buschmann, V. ; Wieder, Thomas ; Fuess, H. (2000)
Microstructure analysis of Ohmic contacts on MBE grown n-GaSb layers and investigation of submicron contacts.
Conference or Workshop Item, Bibliographie

Item Type: Conference or Workshop Item
Erschienen: 2000
Creators: Sigmund, Jochen ; Saglam, M. ; Vogt, Alexander ; Hartnagel, H. L. ; Buschmann, V. ; Wieder, Thomas ; Fuess, H.
Type of entry: Bibliographie
Title: Microstructure analysis of Ohmic contacts on MBE grown n-GaSb layers and investigation of submicron contacts
Language: English
Date: 1 January 2000
Series: MBE-XI: International Conference on Molecular Beam Epitaxy <11, 2000, Beijing, China>: Abstract Book.S. 275
Divisions: 11 Department of Materials and Earth Sciences
11 Department of Materials and Earth Sciences > Material Science
11 Department of Materials and Earth Sciences > Material Science > Structure Research
18 Department of Electrical Engineering and Information Technology
18 Department of Electrical Engineering and Information Technology > Microwave Electronics
Date Deposited: 19 Nov 2008 16:25
Last Modified: 14 Feb 2019 10:47
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