Gastel, Michael ; Breuer, U. ; Holzbrecher, H. ; Kubon, M. ; Becker, J. S. ; Dietze, H.-J. ; Wagner, H. (1997):
Investigation of cross-contaminations near the TCO/p-layer interface of a-Si thin film solar cells using SNMS and SIMS.
In: International Conference on Secondary Ion Mass Spectrometry <10, 1997>: Proceedings. Hrsg.: A. Benninghoven (u.a.) S. 913-916. - Chichester: Wiley, 1997, Chichester, Wiley, [Conference or Workshop Item]
| Item Type: | Conference or Workshop Item |
|---|---|
| Erschienen: | 1997 |
| Creators: | Gastel, Michael ; Breuer, U. ; Holzbrecher, H. ; Kubon, M. ; Becker, J. S. ; Dietze, H.-J. ; Wagner, H. |
| Title: | Investigation of cross-contaminations near the TCO/p-layer interface of a-Si thin film solar cells using SNMS and SIMS |
| Language: | English |
| Series: | International Conference on Secondary Ion Mass Spectrometry <10, 1997>: Proceedings. Hrsg.: A. Benninghoven (u.a.) S. 913-916. - Chichester: Wiley, 1997 |
| Place of Publication: | Chichester |
| Publisher: | Wiley |
| Divisions: | 11 Department of Materials and Earth Sciences > Department of Earth Sciences (1999 merged into Department of Materials and Earth Sciences) 11 Department of Materials and Earth Sciences |
| Date Deposited: | 19 Nov 2008 16:23 |
| License: | [undefiniert] |
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