| Item Type: |
Conference or Workshop Item
|
| Erschienen: |
1998 |
| Creators: |
Brandt, Michael ; Krozer, V. ; Schüßler, M. ; Lin, C. ; Simon, A. ; Vogt, A. ; Rodriguez-Girones Arboli, Manuel ; Parmeggiani, E. ; Grajal, J. |
| Type of entry: |
Bibliographie |
| Title: |
Application of transmission line pulsed (TLP) stress for thermal and reliability characterisation of compound semiconductor devices |
| Language: |
English |
| Date: |
1998 |
| Place of Publication: |
Tokyo |
| Book Title: |
Reliability Center of Japan (RCJ) Symposium <1998, Tokyo>: Proceedings |
| Event Title: |
Reliability Center of Japan (RCJ) Symposium |
| Event Location: |
Tokyo |
| Event Dates: |
1998 |
| Divisions: |
18 Department of Electrical Engineering and Information Technology |
| Date Deposited: |
19 Nov 2008 16:20 |
| Last Modified: |
19 Mar 2024 11:49 |
| PPN: |
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| Export: |
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