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High resolution electron microscopy of heavy-ion induced defects in superconducting Bi-2212 thin films in relations to their effect on Jc

Wiesner, J. (1996):
High resolution electron microscopy of heavy-ion induced defects in superconducting Bi-2212 thin films in relations to their effect on Jc.
In: Physica. C 268 (1996), S. 161-172, [Article]

Item Type: Article
Erschienen: 1996
Creators: Wiesner, J.
Title: High resolution electron microscopy of heavy-ion induced defects in superconducting Bi-2212 thin films in relations to their effect on Jc
Language: English
Journal or Publication Title: Physica. C 268 (1996), S. 161-172
Divisions: 11 Department of Materials and Earth Sciences
11 Department of Materials and Earth Sciences > Department of Earth Sciences (1999 merged into Department of Materials and Earth Sciences)
Date Deposited: 19 Nov 2008 15:59
License: [undefiniert]
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