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Number of items: 14.

Strunz, P. ; Gilles, Ralph ; Mukherji, D. ; Wiedenmann, A. (2003):
Anisotropic SANS data evaluation : a faster approach.
36, In: Journal of applied crystallography, (3-1), pp. 854-859. Wiley-Blackwell - STM ; International Union of Crystallography (IUCr), ISSN 0021-8898, e-ISSN 1600-5767,
DOI: 10.1107/S0021889803001705,
[Article]

Strunz, P. ; Mukherji, D. ; Gilles, Ralph ; Rösler, J. ; Wiedenmann, A. (2003):
Small-angle neutron scattering : a tool for microstructural investigation of high temperature materials.
In: Materials science forum, 426-432, pp. 755-760. Trans Tech Publications, ISSN 0255-5476, e-ISSN 1662-9752,
DOI: 10.4028/www.scientific.net/MSF.426-432.755,
[Article]

Mukherji, D. ; Strunz, P. ; Gilles, Ralph ; Rösler, J. ; Wiedenmann, A. ; Fuess, Hartmut (2002):
In situ SANS investigation of precipitate microstructure at elevated temperatures in Re-rich Ni-base superalloy.
In: Applied physics / A, 74, pp. 1074-1076. [Article]

Strunz, P. ; Schumacher, G. ; Chen, W. ; Mukherji, D. ; Gilles, Ralph ; Wiedenmann, A. (2002):
SANS examination of precipitate microstructure in the creep-exposed single-crystal Ni-base superalloy SC16.
In: Applied physics / A, 74, pp. 1083-1085. [Article]

Strunz, P. ; Mukherij, D. ; Gilles, Ralph ; Wiedemann, A. ; Wiedenmann, A. ; Fuess, Hartmut (2001):
Determination of gamma solution temperature in Re-rich Ni-base superalloy by small-angle neutron scattering.
In: Journal of applied crystallography, 34, pp. 541-548. [Article]

Strunz, P. ; Zrnik, J. ; Gilles, Ralph ; Wiedenmann, A. (2000):
Non-destructive SANS study of creep-tested single-crystal Ni-base superalloy CMSX3.
In: Physica B: Condensed Matter, 276-278, pp. 890-891. Elsevier Science Publishing, ISSN 09214526,
DOI: 10.1016/S0921-4526(99)01541-0,
[Article]

Strunz, P. ; Saroun, J. ; Keiderling, U. ; Wiedenmann, A. ; Przenioslo, R. (2000):
General formula of determination of cross-section from measured SANS intensities.
33, In: Journal of applied crystallography, pp. 829-833. [Article]

Betz, Ulrich ; Sturm, A. ; Löffler, J. F. ; Wagner, W. ; Wiedenmann, A. ; Hahn, Horst (2000):
Microstructural development during final-stage-sintering of nanostructured zirconia based ceramics.
281, In: Materials Science and Engineering: A, pp. 68-74. Elsevier Science Publishing, ISSN 09215093,
[Article]

Keiderling, U. ; Wiedenmann, A. ; Srdic, V. ; Winterer, M. ; Hahn, Horst (2000):
Nano-sized ceramics of coated alumina and circonia analyzed with SANS.
33, In: Journal of applied crystallography, pp. 483-487. [Article]

Steriotis, T. A. ; Beltsios, K. ; Mitropoulos, A. C. ; Kanellopoulos, N. K. ; Wiedenmann, A. ; Keiderling, U. (2000):
SANS structural study of a microporous carbonized resole.
276-278, In: Physica B, pp. 903-904. Elsevier, ISSN 0921-4526, e-ISSN 1873-2135,
DOI: 10.1016/S0921-4526(99)01583-5,
[Article]

Gilles, Ralph ; Keiderling, U. ; Strunz, P. ; Wiedenmann, A. ; Fuess, H. (2000):
Silver behenate as a standard for instrumental resolution and wavelength calibration for small angle neutron scattering.
321-324, In: Materials science forum, pp. 264-269. Trans Tech Publications, ISSN 0255-5476, e-ISSN 1662-9752,
DOI: 10.4028/www.scientific.net/MSF.321-324.264,
[Article]

Strunz, P. ; Wiedenmann, A. ; Gilles, R. ; Mukherji, D. ; Zrnik, J. ; Schumacher, G. (2000):
Evaluation procedure for anisotropic SANS.
33, In: Journal of applied crystallography, (3-1), pp. 834-838. International Union of Crystallography, ISSN 0021-8898, e-ISSN 1600-5767,
DOI: 10.1107/S002188980009974X,
[Article]

Keller, T. ; Krist, T. ; Danzig, A. ; Keiderling, U. ; Mezei, F. ; Wiedenmann, A. (2000):
The polarized neutron small angle scattering instrument at BENSC Berlin.
451, In: Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, pp. 474-479. ISSN 01689002,
[Article]

Keiderling, U. ; Gilles, R. ; Wiedenmann, A. (1999):
Application of silver behenate powder for wavelength calibration of a SANS instrument - a comprehansive study of experimental setup variations and data processing techniques.
32, In: Journal of applied crystallography, pp. 456-463. [Article]

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