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SANS examination of precipitate microstructure in the creep-exposed single-crystal Ni-base superalloy SC16

Strunz, P. and Schumacher, G. and Chen, W. and Mukherji, D. and Gilles, Ralph and Wiedenmann, A. (2002):
SANS examination of precipitate microstructure in the creep-exposed single-crystal Ni-base superalloy SC16.
In: Applied physics / A, 74. pp. 1083-1085, [Article]

Item Type: Article
Erschienen: 2002
Creators: Strunz, P. and Schumacher, G. and Chen, W. and Mukherji, D. and Gilles, Ralph and Wiedenmann, A.
Title: SANS examination of precipitate microstructure in the creep-exposed single-crystal Ni-base superalloy SC16
Language: English
Journal or Publication Title: Applied physics / A
Journal volume: 74
Divisions: 11 Department of Materials and Earth Sciences
Date Deposited: 20 Nov 2008 08:16
License: [undefiniert]
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