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Strunz, P. ; Schumacher, G. ; Chen, W. ; Mukherji, D. ; Gilles, Ralph ; Wiedenmann, A. (2002):
SANS examination of precipitate microstructure in the creep-exposed single-crystal Ni-base superalloy SC16.
In: Applied physics / A, 74, pp. 1083-1085. [Article]

Strunz, P. ; Wiedenmann, A. ; Gilles, R. ; Mukherji, D. ; Zrnik, J. ; Schumacher, G. (2000):
Evaluation procedure for anisotropic SANS.
33, In: Journal of applied crystallography, (3-1), pp. 834-838. International Union of Crystallography, ISSN 0021-8898, e-ISSN 1600-5767,
DOI: 10.1107/S002188980009974X,
[Article]

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