Strunz, P. ; Schumacher, G. ; Chen, W. ; Mukherji, D. ; Gilles, Ralph ; Wiedenmann, A. (2002)
SANS examination of precipitate microstructure in the creep-exposed single-crystal Ni-base superalloy SC16.
In: Applied physics / A, 74
Artikel, Bibliographie

Strunz, P. ; Wiedenmann, A. ; Gilles, R. ; Mukherji, D. ; Zrnik, J. ; Schumacher, G. (2000)
Evaluation procedure for anisotropic SANS.
In: Journal of applied crystallography, 33 (3-1)
doi: 10.1107/S002188980009974X
Artikel, Bibliographie