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Strunz, P. and Schumacher, G. and Chen, W. and Mukherji, D. and Gilles, Ralph and Wiedenmann, A. (2002):
SANS examination of precipitate microstructure in the creep-exposed single-crystal Ni-base superalloy SC16.
In: Applied physics / A, 74. pp. 1083-1085, [Article]

Strunz, P. and Wiedenmann, A. and Gilles, R. and Mukherji, D. and Zrnik, J. and Schumacher, G. (2000):
Evaluation procedure for anisotropic SANS.
In: Journal of applied crystallography, 33pp. 834-838, [Article]

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