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Vetrano, J. S. ; Kleebe, H.-J. ; Hampp, E. ; Hoffmann, M. J. ; Rühle, M. ; Cannon, R. M. (1993):
Yb2O3-Fluxed Sintered Silicon Nitride, Part 1 Microstructure Characterization.
In: Journal of Materials Science, 28 (13), pp. 3529-3538. Springer Nature, DOI: 10.1007/bf01159834,
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Vetrano, J. S. ; Kleebe, H.-J. ; Hampp, E. ; Hoffmann, M. J. ; Cannon, R. M. (1992):
Epitaxial Deposition of Silicon-Nitride During Post-Sintering Heat-Treatment.
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