Sträter, H. ; Brüggemann, R. ; Siol, S. ; Klein, Andreas ; Jaegermann, W. ; Bauer, G. H. (2013)
Detailed photoluminescence studies of thin film Cu2S for determination of quasi-Fermi level splitting and defect levels.
In: Journal of Applied Physics, 114 (23)
doi: 10.1063/1.4850955
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