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Detailed photoluminescence studies of thin film Cu2S for determination of quasi-Fermi level splitting and defect levels

Sträter, H. and Brüggemann, R. and Siol, S. and Klein, Andreas and Jaegermann, W. and Bauer, G. H. (2013):
Detailed photoluminescence studies of thin film Cu2S for determination of quasi-Fermi level splitting and defect levels.
In: Journal of Applied Physics, p. 233506, 114, (23), ISSN 00218979,
[Online-Edition: http://dx.doi.org/10.1063/1.4850955],
[Article]

Item Type: Article
Erschienen: 2013
Creators: Sträter, H. and Brüggemann, R. and Siol, S. and Klein, Andreas and Jaegermann, W. and Bauer, G. H.
Title: Detailed photoluminescence studies of thin film Cu2S for determination of quasi-Fermi level splitting and defect levels
Language: English
Journal or Publication Title: Journal of Applied Physics
Volume: 114
Number: 23
Divisions: 11 Department of Materials and Earth Sciences
11 Department of Materials and Earth Sciences > Material Science
11 Department of Materials and Earth Sciences > Material Science > Surface Science
Date Deposited: 28 Mar 2015 15:37
Official URL: http://dx.doi.org/10.1063/1.4850955
Identification Number: doi:10.1063/1.4850955
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