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Sträter, H. and Brüggemann, R. and Siol, S. and Klein, Andreas and Jaegermann, W. and Bauer, G. H. (2013):
Detailed photoluminescence studies of thin film Cu2S for determination of quasi-Fermi level splitting and defect levels.
In: Journal of Applied Physics, p. 233506, 114, (23), ISSN 00218979,
[Online-Edition: http://dx.doi.org/10.1063/1.4850955],
[Article]

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