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Schepp, Oliver (1998):
Simulations- und Meßmethoden zur Bestimmung der Temperatur von LeistungsMOSFETs.
282Düsseldorf: VDI-Verl., 1998. XVII,174 S,
Düsseldorf, VDI-Verl, TU Darmstadt, [Ph.D. Thesis]

Schepp, Oliver and Kostka, (1997):
An electrothermal model for DMOS devices in ELDO applied to the simulation of an integrated H-bridge.
In: European Conference on Power Electronics and Applications <7, 1997, Trondheim, Norway>: Proceedings, [Conference or Workshop Item]

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