TU Darmstadt / ULB / TUbiblio

Browse by Person

Up a level
Export as [feed] Atom [feed] RSS 1.0 [feed] RSS 2.0
Group by: No Grouping | Item Type | Date | Language
Number of items: 1.

Estevez-Rams, E. and Penton, A. and Martinez-Garcia, J. and Fuess, Hartmut (2005):
The use of analytical peak profile functions to fit diffraction data of planar faulted layer crystals.
In: Crystal research and technology, 40. pp. 166-176, [Article]

This list was generated on Tue Sep 29 01:27:41 2020 CEST.