TU Darmstadt / ULB / TUbiblio

The use of analytical peak profile functions to fit diffraction data of planar faulted layer crystals

Estevez-Rams, E. and Penton, A. and Martinez-Garcia, J. and Fuess, Hartmut (2005):
The use of analytical peak profile functions to fit diffraction data of planar faulted layer crystals.
In: Crystal research and technology, 40. pp. 166-176, [Article]

Item Type: Article
Erschienen: 2005
Creators: Estevez-Rams, E. and Penton, A. and Martinez-Garcia, J. and Fuess, Hartmut
Title: The use of analytical peak profile functions to fit diffraction data of planar faulted layer crystals
Language: English
Journal or Publication Title: Crystal research and technology
Journal volume: 40
Divisions: 11 Department of Materials and Earth Sciences
Date Deposited: 20 Nov 2008 08:24
License: [undefiniert]
Export:
Suche nach Titel in: TUfind oder in Google
Send an inquiry Send an inquiry

Options (only for editors)
Show editorial Details Show editorial Details