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Estevez-Rams, E. and Penton, A. and Martinez-Garcia, J. and Fuess, Hartmut (2005):
The use of analytical peak profile functions to fit diffraction data of planar faulted layer crystals.
In: Crystal research and technology, 40. pp. 166-176, [Article]

Estevez-Rams, E. and Aragon-Fernandez, B. and Fuess, Hartmut and Penton-Madrigal, A. (2003):
Diffraction pattern of stacked layer crystals.
In: Physical review / B, 68. pp. 64111-12, [Article]

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