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Chung, U.-C. and Michau, D. and Elissalde, C. and Li, S. and Klein, Andreas and Maglione, M. (2012):
Evidence of diffusion at BaTiO3/silicon interfaces.
In: Thin Solid Films, Elsevier Science Publishing, pp. 1997-2000, 520, (6), ISSN 00406090,
[Online-Edition: http://dx.doi.org/10.1016/j.tsf.2011.09.055],
[Article]

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