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Chung, U.-C. ; Michau, D. ; Elissalde, C. ; Li, S. ; Klein, Andreas ; Maglione, M. (2012):
Evidence of diffusion at BaTiO3/silicon interfaces.
In: Thin Solid Films, 520 (6), pp. 1997-2000. Elsevier Science Publishing, ISSN 00406090,
[Article]

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