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Critical discussion of ex situ and in situ TEM measurements on memristive devices.
In: Bio-inspired information pathways : from neuroscience to neutronics
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Neelisetty, Krishna Kanth ; Mu, Xiaoke ; Gutsch, Sebastian ; Vahl, Alexander ; Molinari, Alan ; Seggern, Falk von ; Hansen, Mirko ; Scherer, Torsten ; Zacharias, Margit ; Kienle, Lorenz ; Chakravadhanula, V. S. Kiran ; Kübel, Christian (2019)
Electron Beam Effects on Oxide Thin Films—Structure and Electrical Property Correlations.
In: Microscopy and Microanalysis, 25 (3)
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