Neelisetty, Krishna Kanth ; Mu, Xiaoke ; Gutsch, Sebastian ; Vahl, Alexander ; Molinari, Alan ; Seggern, Falk von ; Hansen, Mirko ; Scherer, Torsten ; Zacharias, Margit ; Kienle, Lorenz ; Chakravadhanula, V. S. Kiran ; Kübel, Christian (2019):
Electron Beam Effects on Oxide Thin Films—Structure and Electrical Property Correlations.
In: Microscopy and Microanalysis, 25 (3), pp. 592-600. Cambridge University Press, ISSN 1431-9276,
DOI: 10.1017/S1431927619000175,
[Article]