Neelisetty, Krishna Kanth and Mu, Xiaoke and Gutsch, Sebastian and Vahl, Alexander and Molinari, Alan and von Seggern, Falk and Hansen, Mirko and Scherer, Torsten and Zacharias, Margit and Kienle, Lorenz and Chakravadhanula, V. S. Kiran and Kübel, Christian (2019):
Electron Beam Effects on Oxide Thin Films—Structure and Electrical Property Correlations.
In: Microscopy and Microanalysis, 25 (3), pp. 592-600. Cambridge University Press, ISSN 1431-9276,
DOI: 10.1017/S1431927619000175,
[Article]