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Electron Beam Effects on Oxide Thin Films—Structure and Electrical Property Correlations

Neelisetty, Krishna Kanth and Mu, Xiaoke and Gutsch, Sebastian and Vahl, Alexander and Molinari, Alan and von Seggern, Falk and Hansen, Mirko and Scherer, Torsten and Zacharias, Margit and Kienle, Lorenz and Chakravadhanula, V. S. Kiran and Kübel, Christian (2019):
Electron Beam Effects on Oxide Thin Films—Structure and Electrical Property Correlations.
In: Microscopy and Microanalysis, 25 (3), pp. 592-600. Cambridge University Press, ISSN 1431-9276,
DOI: 10.1017/S1431927619000175,
[Article]

Item Type: Article
Erschienen: 2019
Creators: Neelisetty, Krishna Kanth and Mu, Xiaoke and Gutsch, Sebastian and Vahl, Alexander and Molinari, Alan and von Seggern, Falk and Hansen, Mirko and Scherer, Torsten and Zacharias, Margit and Kienle, Lorenz and Chakravadhanula, V. S. Kiran and Kübel, Christian
Title: Electron Beam Effects on Oxide Thin Films—Structure and Electrical Property Correlations
Language: English
Journal or Publication Title: Microscopy and Microanalysis
Journal volume: 25
Number: 3
Publisher: Cambridge University Press
Divisions: 11 Department of Materials and Earth Sciences
11 Department of Materials and Earth Sciences > Material Science
11 Department of Materials and Earth Sciences > Material Science > In-situ electron microscopy
Date Deposited: 29 May 2020 08:15
DOI: 10.1017/S1431927619000175
Official URL: https://doi.org/10.1017/S1431927619000175
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