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Electron Beam Effects on Oxide Thin Films—Structure and Electrical Property Correlations

Neelisetty, Krishna Kanth ; Mu, Xiaoke ; Gutsch, Sebastian ; Vahl, Alexander ; Molinari, Alan ; Seggern, Falk von ; Hansen, Mirko ; Scherer, Torsten ; Zacharias, Margit ; Kienle, Lorenz ; Chakravadhanula, V. S. Kiran ; Kübel, Christian (2019):
Electron Beam Effects on Oxide Thin Films—Structure and Electrical Property Correlations.
In: Microscopy and Microanalysis, 25 (3), pp. 592-600. Cambridge University Press, ISSN 1431-9276,
DOI: 10.1017/S1431927619000175,
[Article]

Item Type: Article
Erschienen: 2019
Creators: Neelisetty, Krishna Kanth ; Mu, Xiaoke ; Gutsch, Sebastian ; Vahl, Alexander ; Molinari, Alan ; Seggern, Falk von ; Hansen, Mirko ; Scherer, Torsten ; Zacharias, Margit ; Kienle, Lorenz ; Chakravadhanula, V. S. Kiran ; Kübel, Christian
Title: Electron Beam Effects on Oxide Thin Films—Structure and Electrical Property Correlations
Language: English
Journal or Publication Title: Microscopy and Microanalysis
Journal volume: 25
Number: 3
Publisher: Cambridge University Press
Divisions: 11 Department of Materials and Earth Sciences
11 Department of Materials and Earth Sciences > Material Science
11 Department of Materials and Earth Sciences > Material Science > In-situ electron microscopy
Date Deposited: 29 May 2020 08:15
DOI: 10.1017/S1431927619000175
Official URL: https://doi.org/10.1017/S1431927619000175
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