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Manca, J. ; Croes, K. ; De Ceuninck, W. ; De Schepper, L. ; Dieval, B. ; Hartnagel, H. L.
Papanicolaou, Nick (ed.) Naval Research Laboratory (Corporate Creator) (2000):
High temperature time dependent dielectric breakdown of power MOSFETs.
In: Reliabiblity, lifetime and testing : session V, pp. o. A., [Book Section]

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